Iron self-diffusion in amorphousFeZr∕Fe57Zrmultilayers measured by neutron reflectometry

Nitrogen diffusion in amorphous silicon nitride isotope multilayers probed by neutron reflectometry.

Amorphous silicon nitride is a model system for a covalently bound amorphous solid with a low atomic mobility where reasonable values of self-diffusivities are still lacking. We used neutron reflectometry on isotope enriched Si3 14N4/Si3 15N4 multilayers to determine nitrogen self-diffusivities ranging from 10(-24) to 10(-21) m2/s between 950 and 1250 degrees C. Time dependent diffusivities obs...

Evaluation of Nitrogen Diffusion in Plasma Nitrided Iron by Various

   Diffusion of nitrogen in plasma nitrided iron and structural evolution during the nitriding process were evaluated by several characterization techniques including optical microscopy (OM), microhardness depth profiling (HDP), scanning electron microscopy (SEM), x-ray diffraction (XRD), glow discharge optical emission spectroscopy (GDOES), and secondary ion mass spectroscopy (SIMS). Plasma ni...

Probing Interfaces in Metals Using Neutron Reflectometry

Solid-state interfaces play a major role in a variety of material properties. They are especially important in determining the behavior of nano-structured materials, such as metallic multilayers. However, interface structure and properties remain poorly understood, in part because the experimental toolbox for characterizing them is limited. Neutron reflectometry (NR) offers unique opportunities...

Retrieval of phase information in neutron reflectometry.

Introduction to Small-Angle Neutron Scattering and Neutron Reflectometry

4 Analysis of Small Angle Scattering Data 10 4.1 Model Independent Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 4.1.1 The Scattering Invariant . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 4.1.2 Porod Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4.1.3 Guinier Analysis . . . . . . . . . . . . . . . . . . . . . ....